Bayesian inversion for the identification of the doping profile in unipolar semiconductor devices

Fuente: arXiv

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Bibliographic Details
Main Authors:	Taghizadeh, Leila, Jüngel, Ansgar
Format:	Preprint
Published:	2024
Subjects:	Numerical Analysis Probability 62F15, 65C05, 65N21, 35J57, 35J60, 35R30
Online Access:	Acceder al recurso
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