Double tips for in-plane polarized near-field microscopy and spectroscopy
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arXiv
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| Auteurs principaux: | , , , , , , |
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| Format: | Preprint |
| Publié: |
2024
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| _version_ | 1866910571900698624 |
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| author | Kusch, Patryk Arcos, Jose Pareja Tsarapkin, Aleksei Deinhart, Victor Harbauer, Karsten Höflich, Katja Reich, Stephanie |
| author_facet | Kusch, Patryk Arcos, Jose Pareja Tsarapkin, Aleksei Deinhart, Victor Harbauer, Karsten Höflich, Katja Reich, Stephanie |
| contents | Near-field optical microscopy and spectroscopy provide high-resolution imaging below the diffraction limit, crucial in physics, chemistry, and biology for studying molecules, nanoparticles, and viruses. These techniques use a sharp metallic tip of an atomic force microscope (AFM) to enhance incoming and scattered light by excited near-fields at the tip apex leading to high sensitivity and a spatial resolution of a few nanometers. However, this restricts the near-field orientation to out-of-plane polarization, limiting optical polarization choices. We introduce double tips that offer in-plane polarization for enhanced imaging and spectroscopy. These double tips provide superior enhancement over single tips, although with a slightly lower spatial resolution (~30nm). They enable advanced studies of nanotubes, graphene defects, and transition metal dichalcogenides, benefiting from polarization control. The double tips allow varied polarization in tip-enhanced Raman scattering and selective excitation of transverse-electric and -magnetic polaritons, expanding the range of nanoscale samples that can be studied. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2408_11534 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Double tips for in-plane polarized near-field microscopy and spectroscopy Kusch, Patryk Arcos, Jose Pareja Tsarapkin, Aleksei Deinhart, Victor Harbauer, Karsten Höflich, Katja Reich, Stephanie Optics Applied Physics Near-field optical microscopy and spectroscopy provide high-resolution imaging below the diffraction limit, crucial in physics, chemistry, and biology for studying molecules, nanoparticles, and viruses. These techniques use a sharp metallic tip of an atomic force microscope (AFM) to enhance incoming and scattered light by excited near-fields at the tip apex leading to high sensitivity and a spatial resolution of a few nanometers. However, this restricts the near-field orientation to out-of-plane polarization, limiting optical polarization choices. We introduce double tips that offer in-plane polarization for enhanced imaging and spectroscopy. These double tips provide superior enhancement over single tips, although with a slightly lower spatial resolution (~30nm). They enable advanced studies of nanotubes, graphene defects, and transition metal dichalcogenides, benefiting from polarization control. The double tips allow varied polarization in tip-enhanced Raman scattering and selective excitation of transverse-electric and -magnetic polaritons, expanding the range of nanoscale samples that can be studied. |
| title | Double tips for in-plane polarized near-field microscopy and spectroscopy |
| topic | Optics Applied Physics |
| url | https://arxiv.org/abs/2408.11534 |