Efficient nanoscale imaging of solid-state phase transitions by transmission electron microscopy demonstrated on vanadium dioxide nanoparticles
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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866909293402390528 |
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| author | Horák, Michal Kepič, Peter Kabát, Jiří Hájek, Martin Ligmajer, Filip Konečná, Andrea Šikola, Tomáš Křápek, Vlastimil |
| author_facet | Horák, Michal Kepič, Peter Kabát, Jiří Hájek, Martin Ligmajer, Filip Konečná, Andrea Šikola, Tomáš Křápek, Vlastimil |
| contents | We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide nanoparticles as an example, we characterize lattice and electronic signatures of the phase transition using analytical transmission electron microscopy including diffraction and electron energy-loss spectroscopy. We demonstrate that ADF-STEM shows a clear contrast across the transition, interpreted with the help of convergent electron beam diffraction as stemming from the crystal-lattice modification accompanying the transition. In addition, ADF-STEM utilizes 3--6 orders of magnitude lower electron dose when compared to electron microscopy techniques able to reveal the phase transition with the same spatial resolution and universality. The benefits of ADF-STEM are emphasized by recording a full hysteresis loop for the metal-insulator transition of a single vanadium dioxide nanoparticle. Our study opens the prospect for fast, non-destructive, large-area and nanoscale characterization of solid-state phase transitions. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2408_11972 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Efficient nanoscale imaging of solid-state phase transitions by transmission electron microscopy demonstrated on vanadium dioxide nanoparticles Horák, Michal Kepič, Peter Kabát, Jiří Hájek, Martin Ligmajer, Filip Konečná, Andrea Šikola, Tomáš Křápek, Vlastimil Materials Science We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide nanoparticles as an example, we characterize lattice and electronic signatures of the phase transition using analytical transmission electron microscopy including diffraction and electron energy-loss spectroscopy. We demonstrate that ADF-STEM shows a clear contrast across the transition, interpreted with the help of convergent electron beam diffraction as stemming from the crystal-lattice modification accompanying the transition. In addition, ADF-STEM utilizes 3--6 orders of magnitude lower electron dose when compared to electron microscopy techniques able to reveal the phase transition with the same spatial resolution and universality. The benefits of ADF-STEM are emphasized by recording a full hysteresis loop for the metal-insulator transition of a single vanadium dioxide nanoparticle. Our study opens the prospect for fast, non-destructive, large-area and nanoscale characterization of solid-state phase transitions. |
| title | Efficient nanoscale imaging of solid-state phase transitions by transmission electron microscopy demonstrated on vanadium dioxide nanoparticles |
| topic | Materials Science |
| url | https://arxiv.org/abs/2408.11972 |