EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Cios, Grzegorz, Winkelmann, Aimo, Nolze, Gert, Tokarski, Tomasz, Jany, Benedykt R., Bała, Piotr
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2408.13104