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Foundational Model for Electron Micrograph Analysis: Instruction-Tuning Small-Scale Language-and-Vision Assistant for Enterprise Adoption

Fuente: arXiv

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Bibliographic Details
Main Authors:	Srinivas, Sakhinana Sagar, Ravuru, Chidaksh, Sannidhi, Geethan, Runkana, Venkataramana
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence Machine Learning
Online Access:	Acceder al recurso
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