As Biased as You Measure: Methodological Pitfalls of Bias Evaluations in Speaker Verification Research

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hutiri, Wiebke, Patel, Tanvina, Ding, Aaron Yi, Scharenborg, Odette
Format:	Preprint
Published:	2024
Subjects:	Audio and Speech Processing Computers and Society
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.13614