Srinivas, S. S., Sannidhi, G., Gangasani, S., Ravuru, C., & Runkana, V. (2024). Preliminary Investigations of a Multi-Faceted Robust and Synergistic Approach in Semiconductor Electron Micrograph Analysis: Integrating Vision Transformers with Large Language and Multimodal Models.
Style de citation Chicago (17e éd.)Srinivas, Sakhinana Sagar, Geethan Sannidhi, Sreeja Gangasani, Chidaksh Ravuru, et Venkataramana Runkana. Preliminary Investigations of a Multi-Faceted Robust and Synergistic Approach in Semiconductor Electron Micrograph Analysis: Integrating Vision Transformers with Large Language and Multimodal Models. 2024.
Style de citation MLA (9e éd.)Srinivas, Sakhinana Sagar, et al. Preliminary Investigations of a Multi-Faceted Robust and Synergistic Approach in Semiconductor Electron Micrograph Analysis: Integrating Vision Transformers with Large Language and Multimodal Models. 2024.