Preliminary Investigations of a Multi-Faceted Robust and Synergistic Approach in Semiconductor Electron Micrograph Analysis: Integrating Vision Transformers with Large Language and Multimodal Models

Fuente: arXiv

Guardado en:

Detalles Bibliográficos
Autores principales:	Srinivas, Sakhinana Sagar, Sannidhi, Geethan, Gangasani, Sreeja, Ravuru, Chidaksh, Runkana, Venkataramana
Formato:	Preprint
Publicado:	2024
Materias:	Computer Vision and Pattern Recognition Artificial Intelligence Computation and Language Machine Learning
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

Internet

https://arxiv.org/abs/2408.13621