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Autori principali: Mondal, Shubham, Tanim, Md Mehedi Hasan, Baucom, Garrett, Dabas, Shaurya S., Gao, Jinghan, Gaddam, Venkateswarlu, Liu, Jiangnan, Ross, Aiden, Chen, Long-Qing, Kim, Honggyu, Tabrizian, Roozbeh, Mi, Zetian
Natura: Preprint
Pubblicazione: 2024
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Accesso online:https://arxiv.org/abs/2408.15770
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author Mondal, Shubham
Tanim, Md Mehedi Hasan
Baucom, Garrett
Dabas, Shaurya S.
Gao, Jinghan
Gaddam, Venkateswarlu
Liu, Jiangnan
Ross, Aiden
Chen, Long-Qing
Kim, Honggyu
Tabrizian, Roozbeh
Mi, Zetian
author_facet Mondal, Shubham
Tanim, Md Mehedi Hasan
Baucom, Garrett
Dabas, Shaurya S.
Gao, Jinghan
Gaddam, Venkateswarlu
Liu, Jiangnan
Ross, Aiden
Chen, Long-Qing
Kim, Honggyu
Tabrizian, Roozbeh
Mi, Zetian
contents The incorporation of rare-earth elements in wurtzite nitride semiconductors, e.g., scandium alloyed aluminum nitride (ScAlN), promises dramatically enhanced piezoelectric responses, critical to a broad range of acoustic, electronic, photonic, and quantum devices and applications. Experimentally, however, the measured piezoelectric responses of nitride semiconductors are far below what theory has predicted. Here, we show that the use of a simple, scalable, post-growth thermal annealing process can dramatically boost the piezoelectric response of ScAlN thin films. We achieve a remarkable 3.5-fold increase in the piezoelectric modulus, d33 for 30% Sc content ScAlN, from 12.3 pC/N in the as-grown state to 45.5 pC/N, which is eight times larger than that of AlN. The enhancement in piezoelectricity has been unambiguously confirmed by three separate measurement techniques. Such a dramatic enhancement of d33 has been shown to impact the effective electromechanical coupling coefficient kt2 : increasing it from 13.8% to 76.2%, which matches the highest reported values in millimeter thick lithium niobate films but is achieved in a 100 nm ScAlN with a 10,000 fold reduction in thickness, thus promising extreme frequency scaling opportunities for bulk acoustic wave resonators for beyond 5G applications. By utilizing a range of material characterization techniques, we have elucidated the underlying mechanisms for the dramatically enhanced piezoelectric responses, including improved structural quality at the macroscopic scale, more homogeneous and ordered distribution of domain structures at the mesoscopic scale, and the reduction of lattice parameter ratio (c/a) for the wurtzite crystal structure at the atomic scale. Overall, the findings present a simple yet highly effective pathway that can be extended to other material families to further enhance their piezo responses.
format Preprint
id arxiv_https___arxiv_org_abs_2408_15770
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Unprecedented Enhancement of Piezoelectricity in Wurtzite Nitride Semiconductors via Thermal Annealing
Mondal, Shubham
Tanim, Md Mehedi Hasan
Baucom, Garrett
Dabas, Shaurya S.
Gao, Jinghan
Gaddam, Venkateswarlu
Liu, Jiangnan
Ross, Aiden
Chen, Long-Qing
Kim, Honggyu
Tabrizian, Roozbeh
Mi, Zetian
Materials Science
The incorporation of rare-earth elements in wurtzite nitride semiconductors, e.g., scandium alloyed aluminum nitride (ScAlN), promises dramatically enhanced piezoelectric responses, critical to a broad range of acoustic, electronic, photonic, and quantum devices and applications. Experimentally, however, the measured piezoelectric responses of nitride semiconductors are far below what theory has predicted. Here, we show that the use of a simple, scalable, post-growth thermal annealing process can dramatically boost the piezoelectric response of ScAlN thin films. We achieve a remarkable 3.5-fold increase in the piezoelectric modulus, d33 for 30% Sc content ScAlN, from 12.3 pC/N in the as-grown state to 45.5 pC/N, which is eight times larger than that of AlN. The enhancement in piezoelectricity has been unambiguously confirmed by three separate measurement techniques. Such a dramatic enhancement of d33 has been shown to impact the effective electromechanical coupling coefficient kt2 : increasing it from 13.8% to 76.2%, which matches the highest reported values in millimeter thick lithium niobate films but is achieved in a 100 nm ScAlN with a 10,000 fold reduction in thickness, thus promising extreme frequency scaling opportunities for bulk acoustic wave resonators for beyond 5G applications. By utilizing a range of material characterization techniques, we have elucidated the underlying mechanisms for the dramatically enhanced piezoelectric responses, including improved structural quality at the macroscopic scale, more homogeneous and ordered distribution of domain structures at the mesoscopic scale, and the reduction of lattice parameter ratio (c/a) for the wurtzite crystal structure at the atomic scale. Overall, the findings present a simple yet highly effective pathway that can be extended to other material families to further enhance their piezo responses.
title Unprecedented Enhancement of Piezoelectricity in Wurtzite Nitride Semiconductors via Thermal Annealing
topic Materials Science
url https://arxiv.org/abs/2408.15770