Cita APA (7a ed.)

Hegedüs, M., Banerjee, R., Hutcheson, A., Barker, T., Mahashabde, S., Danilov, A. V., . . . de Graaf, S. E. (2024). In-situ scanning gate imaging of individual two-level material defects in live superconducting quantum circuits.

Cita Chicago Style (17a ed.)

Hegedüs, M., R. Banerjee, A. Hutcheson, T. Barker, S. Mahashabde, A. V. Danilov, S. E. Kubatkin, V. Antonov, y S. E. de Graaf. In-situ Scanning Gate Imaging of Individual Two-level Material Defects in Live Superconducting Quantum Circuits. 2024.

Cita MLA (9a ed.)

Hegedüs, M., et al. In-situ Scanning Gate Imaging of Individual Two-level Material Defects in Live Superconducting Quantum Circuits. 2024.