In-situ scanning gate imaging of individual two-level material defects in live superconducting quantum circuits
Fuente:
arXiv
Guardado en:
| Autores principales: | Hegedüs, M., Banerjee, R., Hutcheson, A., Barker, T., Mahashabde, S., Danilov, A. V., Kubatkin, S. E., Antonov, V., de Graaf, S. E. |
|---|---|
| Formato: | Preprint |
| Publicado: |
2024
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
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