Multifaceted nature of defect tolerance in halide perovskites and emerging semiconductors

Fuente: arXiv
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Bibliographic Details
Main Authors: Mosquera-Lois, Irea, Huang, Yi-Teng, Lohan, Hugh, Ye, Junzhi, Walsh, Aron, Hoye, Robert L. Z.
Format: Preprint
Published: 2024
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