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Multifaceted nature of defect tolerance in halide perovskites and emerging semiconductors

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Mosquera-Lois, Irea, Huang, Yi-Teng, Lohan, Hugh, Ye, Junzhi, Walsh, Aron, Hoye, Robert L. Z.
Formato:	Preprint
Publicado:	2024
Materias:	Materials Science Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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