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Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Liu, Yang, Gong, Jiarui, Acharya, Sudip, Lia, Yiran, Abrand, Alireza, Rudie, Justin M., Zhou, Jie, Lu, Yi, Abbasi, Haris Naeem, Vincent, Daniel, Haessly, Samuel, Tsai, Tsung-Han, Mohseni, Parsian K., Yu, Shui-Qing, Ma, Zhenqiang
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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