Effect of UV light irradiation on charge neutralization in XPS measurements

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhu, Lei, Yang, Yunguo, Cai, Jianhua, Xu, Xuefeng, Ma, Liran, Luo, Jianbin
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.00663