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Effect of UV light irradiation on charge neutralization in XPS measurements

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Zhu, Lei, Yang, Yunguo, Cai, Jianhua, Xu, Xuefeng, Ma, Liran, Luo, Jianbin
Format:	Preprint
Publié:	2024
Sujets:	Instrumentation and Detectors Materials Science
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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