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Bibliographic Details
Main Authors: Wolf, Edgar, Windisch, Tobias
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2409.03669
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author Wolf, Edgar
Windisch, Tobias
author_facet Wolf, Edgar
Windisch, Tobias
contents Process curves are multivariate finite time series data coming from manufacturing processes. This paper studies machine learning that detect drifts in process curve datasets. A theoretic framework to synthetically generate process curves in a controlled way is introduced in order to benchmark machine learning algorithms for process drift detection. An evaluation score, called the temporal area under the curve, is introduced, which allows to quantify how well machine learning models unveil curves belonging to drift segments. Finally, a benchmark study comparing popular machine learning approaches on synthetic data generated with the introduced framework is presented that shows that existing algorithms often struggle with datasets containing multiple drift segments.
format Preprint
id arxiv_https___arxiv_org_abs_2409_03669
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A method to benchmark high-dimensional process drift detection
Wolf, Edgar
Windisch, Tobias
Machine Learning
Artificial Intelligence
Process curves are multivariate finite time series data coming from manufacturing processes. This paper studies machine learning that detect drifts in process curve datasets. A theoretic framework to synthetically generate process curves in a controlled way is introduced in order to benchmark machine learning algorithms for process drift detection. An evaluation score, called the temporal area under the curve, is introduced, which allows to quantify how well machine learning models unveil curves belonging to drift segments. Finally, a benchmark study comparing popular machine learning approaches on synthetic data generated with the introduced framework is presented that shows that existing algorithms often struggle with datasets containing multiple drift segments.
title A method to benchmark high-dimensional process drift detection
topic Machine Learning
Artificial Intelligence
url https://arxiv.org/abs/2409.03669