SR-CLD: Spatially Resolved Chord Length Distributions for Statistical Description and Visualization of Non-uniform Microstructures
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arXiv
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| Auteurs principaux: | , |
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| Format: | Preprint |
| Publié: |
2024
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| _version_ | 1866908529082761216 |
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| author | Whitman, Sheila E. Latypov, Marat I. |
| author_facet | Whitman, Sheila E. Latypov, Marat I. |
| contents | This study introduces the calculation of spatially-resolved chord length distribution (SR-CLD) as an efficient approach for quantifying and visualizing non-uniform microstructures in heterogeneous materials. SR-CLD enables detailed analysis of spatial variation of microstructures in different directions that can be overlooked with traditional descriptions. We present the calculation of SR-CLD using efficient scan-line algorithm that counts pixels in constituents along pixel rows or columns of microstructure images for detailed, high-resolution SR-CLD maps. We demonstrate the application of SR-CLD in three case studies: on synthetic polycrystalline microstructures with known and intentionally created uniform and gradient spatial distributions of grain size; on non-uniform microstructures from welding simulations; and on experimental images of two-phase microstructures of additively manufactured Ti alloys with significant spatially non-uniform distributions of laths of one of the phases. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_03729 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | SR-CLD: Spatially Resolved Chord Length Distributions for Statistical Description and Visualization of Non-uniform Microstructures Whitman, Sheila E. Latypov, Marat I. Materials Science This study introduces the calculation of spatially-resolved chord length distribution (SR-CLD) as an efficient approach for quantifying and visualizing non-uniform microstructures in heterogeneous materials. SR-CLD enables detailed analysis of spatial variation of microstructures in different directions that can be overlooked with traditional descriptions. We present the calculation of SR-CLD using efficient scan-line algorithm that counts pixels in constituents along pixel rows or columns of microstructure images for detailed, high-resolution SR-CLD maps. We demonstrate the application of SR-CLD in three case studies: on synthetic polycrystalline microstructures with known and intentionally created uniform and gradient spatial distributions of grain size; on non-uniform microstructures from welding simulations; and on experimental images of two-phase microstructures of additively manufactured Ti alloys with significant spatially non-uniform distributions of laths of one of the phases. |
| title | SR-CLD: Spatially Resolved Chord Length Distributions for Statistical Description and Visualization of Non-uniform Microstructures |
| topic | Materials Science |
| url | https://arxiv.org/abs/2409.03729 |