Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yin, Shenwei, Cho, Jin-Woo, Feng, Demeng, Mei, Hongyan, Kumar, Tanuj, Wan, Chenghao, Jin, Yeonghoon, Kim, Minjeong, Kats, Mikhail A.
Format:	Preprint
Published:	2024
Subjects:	Optics Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.05323