Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study
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arXiv
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| Main Authors: | , , , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866916796085305344 |
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| author | Yin, Shenwei Cho, Jin-Woo Feng, Demeng Mei, Hongyan Kumar, Tanuj Wan, Chenghao Jin, Yeonghoon Kim, Minjeong Kats, Mikhail A. |
| author_facet | Yin, Shenwei Cho, Jin-Woo Feng, Demeng Mei, Hongyan Kumar, Tanuj Wan, Chenghao Jin, Yeonghoon Kim, Minjeong Kats, Mikhail A. |
| contents | Fitting oscillator models to variable-angle spectroscopic ellipsometry (VASE) data can lead to non-unique, unphysical results. We demonstrate using temperature-dependent trends to prevent overfitting and ensure model physicality. As a case study, we performed mid-infrared VASE measurements on fused silica (SiO2) of various grades, from room temperature to 600 °C. We fitted oscillator models independently at each temperature, and confirmed the model's physical validity by observing the expected monotonic trends in vibrational oscillator parameters. Using this technique, we generated a highly accurate dataset for the temperature-dependent complex refractive index of fused silica for modeling mid-infrared optical components such as thermal emitters. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_05323 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study Yin, Shenwei Cho, Jin-Woo Feng, Demeng Mei, Hongyan Kumar, Tanuj Wan, Chenghao Jin, Yeonghoon Kim, Minjeong Kats, Mikhail A. Optics Materials Science Applied Physics Fitting oscillator models to variable-angle spectroscopic ellipsometry (VASE) data can lead to non-unique, unphysical results. We demonstrate using temperature-dependent trends to prevent overfitting and ensure model physicality. As a case study, we performed mid-infrared VASE measurements on fused silica (SiO2) of various grades, from room temperature to 600 °C. We fitted oscillator models independently at each temperature, and confirmed the model's physical validity by observing the expected monotonic trends in vibrational oscillator parameters. Using this technique, we generated a highly accurate dataset for the temperature-dependent complex refractive index of fused silica for modeling mid-infrared optical components such as thermal emitters. |
| title | Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study |
| topic | Optics Materials Science Applied Physics |
| url | https://arxiv.org/abs/2409.05323 |