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Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Yin, Shenwei, Cho, Jin-Woo, Feng, Demeng, Mei, Hongyan, Kumar, Tanuj, Wan, Chenghao, Jin, Yeonghoon, Kim, Minjeong, Kats, Mikhail A.
Format:	Preprint
Publié:	2024
Sujets:	Optics Materials Science Applied Physics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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