The nature of silicon PN junction impedance at high frequency

Fuente: arXiv
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Autores principales: van Nijen, David A., Procel, Paul, van Swaaij, René A. C. M. M., Zeman, Miro, Isabella, Olindo, Manganiello, Patrizio
Formato: Preprint
Publicado: 2024
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author van Nijen, David A.
Procel, Paul
van Swaaij, René A. C. M. M.
Zeman, Miro
Isabella, Olindo
Manganiello, Patrizio
author_facet van Nijen, David A.
Procel, Paul
van Swaaij, René A. C. M. M.
Zeman, Miro
Isabella, Olindo
Manganiello, Patrizio
contents A thorough understanding of the small-signal response of solar cells can reveal intrinsic device characteristics and pave the way for innovations. This study investigates the impedance of crystalline silicon PN junction devices using TCAD simulations, focusing on the impact of frequency, bias voltage, and the presence of a low-high (LH) junction. It is shown that the PN junction exhibits a fixed $RC$-loop behavior at low frequencies, but undergoes relaxation in both resistance $R_j$ and capacitance $C_j$ as frequency increases. Moreover, it is revealed that the addition of a LH junction impacts the impedance by altering $R_j$, $C_j$, and the series resistance $R_s$. Contrary to conventional modeling approaches, which often include an additional $RC$-loop to represent the LH junction, this study suggests that such a representation does not represent the underlying physics, particularly the frequency-dependent behavior of $R_j$ and $C_j$.
format Preprint
id arxiv_https___arxiv_org_abs_2409_06749
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle The nature of silicon PN junction impedance at high frequency
van Nijen, David A.
Procel, Paul
van Swaaij, René A. C. M. M.
Zeman, Miro
Isabella, Olindo
Manganiello, Patrizio
Applied Physics
A thorough understanding of the small-signal response of solar cells can reveal intrinsic device characteristics and pave the way for innovations. This study investigates the impedance of crystalline silicon PN junction devices using TCAD simulations, focusing on the impact of frequency, bias voltage, and the presence of a low-high (LH) junction. It is shown that the PN junction exhibits a fixed $RC$-loop behavior at low frequencies, but undergoes relaxation in both resistance $R_j$ and capacitance $C_j$ as frequency increases. Moreover, it is revealed that the addition of a LH junction impacts the impedance by altering $R_j$, $C_j$, and the series resistance $R_s$. Contrary to conventional modeling approaches, which often include an additional $RC$-loop to represent the LH junction, this study suggests that such a representation does not represent the underlying physics, particularly the frequency-dependent behavior of $R_j$ and $C_j$.
title The nature of silicon PN junction impedance at high frequency
topic Applied Physics
url https://arxiv.org/abs/2409.06749