Copertina

Quantifying Implantation Induced Damage and Point Defects with Multislice Electron Ptychography

Fuente: arXiv

Salvato in:

Dettagli Bibliografici
Autori principali:	Kim, Junghwa, Gilgenbach, Colin, Bhat, Aaditya, LeBeau, James
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

Documenti analoghi

Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC
di: Bhat, Aaditya, et al.
Pubblicazione: (2024)

Optimizing Atomic Number Contrast in Multislice Electron Ptychography
di: Denzer, Bridget R., et al.
Pubblicazione: (2025)

Insights into Chemical and Structural Order at Planar Defects in a Functional Oxide Using Multislice Electron Ptychography
di: Zhu, Menglin, et al.
Pubblicazione: (2024)

phaser: A unified and extensible framework for fast electron ptychography
di: Gilgenbach, Colin, et al.
Pubblicazione: (2025)

Grain Boundary Space Charge Engineering of Solid Oxide Electrolytes: Model Thin Film Study
di: Defferriere, Thomas, et al.
Pubblicazione: (2025)

Direct determination of antiferroelectric-to-ferroelectric phase transition pathways in PbZrO$_3$ with Operando Electron Microscopy
di: Zhu, Menglin, et al.
Pubblicazione: (2025)

Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
di: Ribet, Stephanie M., et al.
Pubblicazione: (2024)

Improving Multislice Electron Ptychography with a Generative Prior
di: Belardi, Christian K., et al.
Pubblicazione: (2025)

Operando Electron Microscopy of Nanoscale Electronic Devices on Non-Conductive Substrates
di: Zhu, Menglin, et al.
Pubblicazione: (2025)

Bridging experiment and theory of relaxor ferroelectrics at the atomic scale with multislice electron ptychography
di: Zhu, Menglin, et al.
Pubblicazione: (2024)

Grain Boundary Space Charge Engineering of Solid Oxide Electrolytes: Model Thin Film Study
di: Thomas Defferriere, et al.
Pubblicazione: (2025)

Multislice Hollow Ptychography for Simultaneous Atomic-Layer-Resolved 3D Structural Imaging and Spectroscopy
di: Lei, Yu, et al.
Pubblicazione: (2025)

Atomic Structure of Self-Buffered BaZr(S,Se)$_3$ Epitaxial Thin Film Interfaces
di: Xu, Michael, et al.
Pubblicazione: (2024)

Programmable Beam Control for Electron Energy-Loss Spectroscopy and Ptychography
di: Palos, Mariana, et al.
Pubblicazione: (2025)

3D Mapping of Defects and Moiré Corrugations via Electron Ptychography Atomic Coordinate Retrieval
di: Huang, Jeffrey, et al.
Pubblicazione: (2025)

Depth‐Resolved Imaging of Surfaces and Interfaces in MFI‐Type Zeolite Crystals via Multislice Electron Ptychography
di: Guanxing Li, et al.
Pubblicazione: (2026)

Atom-by-atom Imaging of Moiré Phasons using Electron Ptychography
di: Zhang, Yichao, et al.
Pubblicazione: (2025)

Quantifying Phase Magnitudes of Open-Source Focused-Probe 4D-STEM Ptychography Reconstructions
di: Susi, Toma
Pubblicazione: (2025)

Microstructural and preliminary optical and microwave characterization of erbium doped CaMoO$_4$ thin films
di: Masiulionis, Ignas, et al.
Pubblicazione: (2025)

Anion Ordering and Phase Stability Govern Optical Band Gaps in BaZr(S,Se)3
di: Fransson, Erik, et al.
Pubblicazione: (2026)

A Processing Route to Chalcogenide Perovskites Alloys with Tunable Band Gap via Anion Exchange
di: Ye, Kevin, et al.
Pubblicazione: (2024)

Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging Insights
di: Varnavides, Georgios, et al.
Pubblicazione: (2025)

Electron Ptychography Images Hydrogen Atom Superlattices and 3D Inhomogeneities in Palladium Hydride Nanoparticles
di: Shi, Zixiao, et al.
Pubblicazione: (2025)

Atomic-Scale Heterogeneity of Hydrogen in Metal Hydrides Revealed by Electron Ptychography
di: Li, Pengcheng, et al.
Pubblicazione: (2025)

Thermal Transport in Defective Uranium Nitride: Effects of Point Defects, Anharmonicity, and Electronic Contributions
di: Chen, Beihan, et al.
Pubblicazione: (2026)

Letter to the editor—Answering the call for a scientific consensus regarding the application of retrograde extrapolation to determine blood alcohol content in DUI cases
di: Marc A. LeBeau, et al.
Pubblicazione: (2024)

Eigenstructure Analysis of Bloch Wave and Multislice Formulations for Dynamical Scattering in Transmission Electron Microscopy
di: Bangun, Arya, et al.
Pubblicazione: (2024)

Two-dimensional photonic crystal cavities in ZnSe quantum well structures
di: Qiao, Siqi, et al.
Pubblicazione: (2024)

Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
di: Schloz, Marcel, et al.
Pubblicazione: (2024)

Influence of Point Defects on Laser-Induced Excitation in Silicon
di: Otobe, Tomohito, et al.
Pubblicazione: (2024)

Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography
di: Yuan, Huaicheng, et al.
Pubblicazione: (2025)

Additively manufacturable high-strength aluminum alloys with thermally stable microstructures enabled by hybrid machine learning-based design
di: Taheri-Mousavi, S. Mohadeseh, et al.
Pubblicazione: (2024)

Soft X-ray Reflection Ptychography
di: Guenzing, Damian, et al.
Pubblicazione: (2026)

Perovskite‐Derived Layered Crystal Structure in SrCo0.26Fe0.74O3‐δ Thin Films
di: Eunsoo Cho, et al.
Pubblicazione: (2024)

Perovskite‐Derived Layered Crystal Structure in SrCo0.26Fe0.74O3‐δ Thin Films (Adv. Mater. Interfaces 7/2024)
di: Eunsoo Cho, et al.
Pubblicazione: (2024)

Emergence of unconventional magnetic order in strain-engineered RuO2/TiO2 superlattices
di: Jeong, Seung Gyo, et al.
Pubblicazione: (2026)

3D Atomic-Scale Metrology of Strain Relaxation and Roughness in Gate-All-Around (GAA) Transistors via Electron Ptychography
di: Karapetyan, Shake, et al.
Pubblicazione: (2025)

Multi-Convergence-Angle Ptychography with Simultaneous Strong Contrast and High Resolution
di: Mao, Wei, et al.
Pubblicazione: (2024)

Stands Alone, Faces, and Other Poems
di: Russell LeBeau, Patrick
Pubblicazione: (2025)

Quantifying the Full Damage Profile of Focused Ion Beams via 4D-STEM Precession Electron Diffraction and PSNR Metrics
di: Masteghin, M. G., et al.
Pubblicazione: (2025)