Machine Learning Approaches for Defect Detection in a Microwell-based Medical Device

Fuente: arXiv
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Autori principali: Zhao, Xueying, Chen, Yan, Jiang, Yuefu, Radenbaugh, Amie, Moskwa, Jamie, Jensen, Devon
Natura: Preprint
Pubblicazione: 2024
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author Zhao, Xueying
Chen, Yan
Jiang, Yuefu
Radenbaugh, Amie
Moskwa, Jamie
Jensen, Devon
author_facet Zhao, Xueying
Chen, Yan
Jiang, Yuefu
Radenbaugh, Amie
Moskwa, Jamie
Jensen, Devon
contents Microfluidic devices offer numerous advantages in medical applications, including the capture of single cells in microwell-based platforms for genomic analysis. As the cost of sequencing decreases, the demand for high-throughput single-cell analysis devices increases, leading to more microwells in a single device. However, their small size and large quantity increase the quality control (QC) effort. Currently, QC steps are still performed manually in some devices, requiring intensive training and time and causing inconsistency between different operators. A way to overcome this issue is to through automated defect detection. Computer vision can quickly analyze a large number of images in a short time and can be applied in defect detection. Automated defect detection can replace manual inspection, potentially decreasing variations in QC results. We report a machine learning (ML) algorithm that applies a convolution neural network (CNN) model with 9 layers and 64 units, incorporating dropouts and regularizations. This algorithm can analyze a large number of microwells produced by injection molding, significantly increasing the number of images analyzed compared to manual operator, improving QC, and ensuring the delivery of high-quality products to customers.
format Preprint
id arxiv_https___arxiv_org_abs_2409_07551
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Machine Learning Approaches for Defect Detection in a Microwell-based Medical Device
Zhao, Xueying
Chen, Yan
Jiang, Yuefu
Radenbaugh, Amie
Moskwa, Jamie
Jensen, Devon
Computational Engineering, Finance, and Science
Microfluidic devices offer numerous advantages in medical applications, including the capture of single cells in microwell-based platforms for genomic analysis. As the cost of sequencing decreases, the demand for high-throughput single-cell analysis devices increases, leading to more microwells in a single device. However, their small size and large quantity increase the quality control (QC) effort. Currently, QC steps are still performed manually in some devices, requiring intensive training and time and causing inconsistency between different operators. A way to overcome this issue is to through automated defect detection. Computer vision can quickly analyze a large number of images in a short time and can be applied in defect detection. Automated defect detection can replace manual inspection, potentially decreasing variations in QC results. We report a machine learning (ML) algorithm that applies a convolution neural network (CNN) model with 9 layers and 64 units, incorporating dropouts and regularizations. This algorithm can analyze a large number of microwells produced by injection molding, significantly increasing the number of images analyzed compared to manual operator, improving QC, and ensuring the delivery of high-quality products to customers.
title Machine Learning Approaches for Defect Detection in a Microwell-based Medical Device
topic Computational Engineering, Finance, and Science
url https://arxiv.org/abs/2409.07551