Copertina

Enhancing Printed Circuit Board Defect Detection through Ensemble Learning

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Law, Ka Nam Canaan, Yu, Mingshuo, Zhang, Lianglei, Zhang, Yiyi, Xu, Peng, Gao, Jerry, Liu, Jun
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Machine Learning Artificial Intelligence Computer Vision and Pattern Recognition
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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