Beyond accuracy: quantifying the reliability of Multiple Instance Learning for Whole Slide Image classification

Fuente: arXiv

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Bibliographic Details
Main Authors:	Keshvarikhojasteh, Hassan, Aubreville, Marc, Bertram, Christof A., Pluim, Josien P. W., Veta, Mitko
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.11110