Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
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arXiv
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| Autori principali: | , , , , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| Soggetti: | |
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| _version_ | 1866909318191775744 |
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| author | Hoffmann, Johannes de Preville, Sophie Eckmann, Bruno Lin, Hung-Ju Herzog, Benedikt Haddadi, Kamel Theron, Didier Gramse, Georg Richert, Damien Moran-Meza, Jose Piquemal, Francois |
| author_facet | Hoffmann, Johannes de Preville, Sophie Eckmann, Bruno Lin, Hung-Ju Herzog, Benedikt Haddadi, Kamel Theron, Didier Gramse, Georg Richert, Damien Moran-Meza, Jose Piquemal, Francois |
| contents | In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_11207 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Comparison of Impedance Matching Networks for Scanning Microwave Microscopy Hoffmann, Johannes de Preville, Sophie Eckmann, Bruno Lin, Hung-Ju Herzog, Benedikt Haddadi, Kamel Theron, Didier Gramse, Georg Richert, Damien Moran-Meza, Jose Piquemal, Francois Instrumentation and Detectors In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens. |
| title | Comparison of Impedance Matching Networks for Scanning Microwave Microscopy |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2409.11207 |