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Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Hoffmann, Johannes, de Preville, Sophie, Eckmann, Bruno, Lin, Hung-Ju, Herzog, Benedikt, Haddadi, Kamel, Theron, Didier, Gramse, Georg, Richert, Damien, Moran-Meza, Jose, Piquemal, Francois
Format:	Preprint
Publié:	2024
Sujets:	Instrumentation and Detectors
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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