UL-VIO: Ultra-lightweight Visual-Inertial Odometry with Noise Robust Test-time Adaptation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Park, Jinho, Chun, Se Young, Seok, Mingoo
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.13106