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Main Authors: Yuan, Yifei, Huang, Yuhong, Su, Xin, Duan, Boyang, Hu, Nan, Di Renzo, Marco
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2409.13405
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author Yuan, Yifei
Huang, Yuhong
Su, Xin
Duan, Boyang
Hu, Nan
Di Renzo, Marco
author_facet Yuan, Yifei
Huang, Yuhong
Su, Xin
Duan, Boyang
Hu, Nan
Di Renzo, Marco
contents Reconfigurable intelligent surface (RIS) is an emerging technology for wireless communications. In this paper, extensive system level simulations are conducted for analyzing the performance of multi-RIS and multi-base-station (BS) scenarios, by considering typical settings for industry standards. Pathloss and large-scale fading are taken into account when modeling the RIS cascaded and direct links. The performance metrics considered are the downlink reference signal received power (RSRP) and the signal to interference noise ratio (SINR). The evaluation methodology is compatible with that utilized for technology studies in industry standards development organizations, by considering the uniqueness of RIS. The simulations are comprehensive, and they take into account different layouts of RIS panels and mobiles in a cell, and different densities and sizes of RIS panels. Several practical aspects are considered, including the interference between RIS panels, the phase quantization of RIS elements, and the failure of RIS elements. The impact of near field effects for the RIS-mobile links is analyzed as well. Simulation results demonstrate the potential of RIS-aided deployments in improving the system capacity and cell coverage in 6G mobile systems.
format Preprint
id arxiv_https___arxiv_org_abs_2409_13405
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Reconfigurable Intelligent Surface (RIS) System Level Simulations for Industry Standards
Yuan, Yifei
Huang, Yuhong
Su, Xin
Duan, Boyang
Hu, Nan
Di Renzo, Marco
Information Theory
Reconfigurable intelligent surface (RIS) is an emerging technology for wireless communications. In this paper, extensive system level simulations are conducted for analyzing the performance of multi-RIS and multi-base-station (BS) scenarios, by considering typical settings for industry standards. Pathloss and large-scale fading are taken into account when modeling the RIS cascaded and direct links. The performance metrics considered are the downlink reference signal received power (RSRP) and the signal to interference noise ratio (SINR). The evaluation methodology is compatible with that utilized for technology studies in industry standards development organizations, by considering the uniqueness of RIS. The simulations are comprehensive, and they take into account different layouts of RIS panels and mobiles in a cell, and different densities and sizes of RIS panels. Several practical aspects are considered, including the interference between RIS panels, the phase quantization of RIS elements, and the failure of RIS elements. The impact of near field effects for the RIS-mobile links is analyzed as well. Simulation results demonstrate the potential of RIS-aided deployments in improving the system capacity and cell coverage in 6G mobile systems.
title Reconfigurable Intelligent Surface (RIS) System Level Simulations for Industry Standards
topic Information Theory
url https://arxiv.org/abs/2409.13405