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Main Authors: Hoque, Md Shafkat Bin, Liao, Michael E., Zare, Saman, Liu, Zeyu, Koh, Yee Rui, Huynh, Kenny, Shi, Jingjing, Graham, Samuel, Luo, Tengfei, Ahmad, Habib, Doolittle, W. Alan, Goorsky, Mark S., Hopkins, Patrick E.
Format: Preprint
Published: 2024
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Online Access:https://arxiv.org/abs/2409.14328
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author Hoque, Md Shafkat Bin
Liao, Michael E.
Zare, Saman
Liu, Zeyu
Koh, Yee Rui
Huynh, Kenny
Shi, Jingjing
Graham, Samuel
Luo, Tengfei
Ahmad, Habib
Doolittle, W. Alan
Goorsky, Mark S.
Hopkins, Patrick E.
author_facet Hoque, Md Shafkat Bin
Liao, Michael E.
Zare, Saman
Liu, Zeyu
Koh, Yee Rui
Huynh, Kenny
Shi, Jingjing
Graham, Samuel
Luo, Tengfei
Ahmad, Habib
Doolittle, W. Alan
Goorsky, Mark S.
Hopkins, Patrick E.
contents Bulk AlN possesses high thermal conductivity due to long phonon mean-free-paths, high group velocity, and long lifetimes. However, the thermal transport scenario becomes very different in a thin AlN film due to phonon-defect and phonon-boundary scattering. Herein, we report experimental observation of ballistic to diffusive transition in a series of AlN thin films (1.6 - 2440 nm) grown on sapphire substrates. The ballistic transport is characterized by constant thermal resistance as a function of film thickness due to phonon scattering by defects and boundaries. In this transport regime, phonons possess very small group velocities and lifetimes. The lifetime of the optical phonons increases by more than an order of magnitude in the diffusive regime, however, remains nearly constant afterwards. Our study is important for understanding the details of nano and microscale thermal transport in a highly conductive material.
format Preprint
id arxiv_https___arxiv_org_abs_2409_14328
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Experimental observation of ballistic to diffusive transition in AlN thin films
Hoque, Md Shafkat Bin
Liao, Michael E.
Zare, Saman
Liu, Zeyu
Koh, Yee Rui
Huynh, Kenny
Shi, Jingjing
Graham, Samuel
Luo, Tengfei
Ahmad, Habib
Doolittle, W. Alan
Goorsky, Mark S.
Hopkins, Patrick E.
Applied Physics
Bulk AlN possesses high thermal conductivity due to long phonon mean-free-paths, high group velocity, and long lifetimes. However, the thermal transport scenario becomes very different in a thin AlN film due to phonon-defect and phonon-boundary scattering. Herein, we report experimental observation of ballistic to diffusive transition in a series of AlN thin films (1.6 - 2440 nm) grown on sapphire substrates. The ballistic transport is characterized by constant thermal resistance as a function of film thickness due to phonon scattering by defects and boundaries. In this transport regime, phonons possess very small group velocities and lifetimes. The lifetime of the optical phonons increases by more than an order of magnitude in the diffusive regime, however, remains nearly constant afterwards. Our study is important for understanding the details of nano and microscale thermal transport in a highly conductive material.
title Experimental observation of ballistic to diffusive transition in AlN thin films
topic Applied Physics
url https://arxiv.org/abs/2409.14328