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| Autores principales: | , |
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| Formato: | Preprint |
| Publicado: |
2024
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| Materias: | |
| Acceso en línea: | https://arxiv.org/abs/2409.15358 |
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| _version_ | 1866910617893339136 |
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| author | Hinsberg, William D. Houle, Frances A. |
| author_facet | Hinsberg, William D. Houle, Frances A. |
| contents | The resolution-line edge roughness-sensitivity tradeoff has motivated exploration of potential improvements using defined sequence polymers and polymer-bound photoacid generators and quenchers. In this study we characterize the internal structures of positive tone photoresist polymer films formed from defined sequence polymers and compare them to random copolymers of the same composition. We model their imaging to connect initial to developable film structures. We use a polymer packing algorithm to simulate films of diverse compositions and locations of photoacid generators and quenchers, using the composition of an ESCAP photoresist. We use a simple EUV exposure-deprotection algorithm to model developable image formation within them. In all cases, the spatial distribution of chemical moieties in the film for defined sequence polymers is nearly indistinguishable from random copolymers. We evaluate several exposure-deprotection scenarios, and find that a defined sequence copolymer has a distinctive developable image under certain circumstances. The use of defined sequence polymers within a photoresist layer does not automatically result in improved imaging, however they do have some characteristics different from random polymers of the same composition. Further study of these characteristics may provide a route to improved control over the nanoscale imaging process. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_15358 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | A Comparison of the Spatial Statistics of Random and Defined-Sequence Photoresist Films Hinsberg, William D. Houle, Frances A. Soft Condensed Matter Materials Science The resolution-line edge roughness-sensitivity tradeoff has motivated exploration of potential improvements using defined sequence polymers and polymer-bound photoacid generators and quenchers. In this study we characterize the internal structures of positive tone photoresist polymer films formed from defined sequence polymers and compare them to random copolymers of the same composition. We model their imaging to connect initial to developable film structures. We use a polymer packing algorithm to simulate films of diverse compositions and locations of photoacid generators and quenchers, using the composition of an ESCAP photoresist. We use a simple EUV exposure-deprotection algorithm to model developable image formation within them. In all cases, the spatial distribution of chemical moieties in the film for defined sequence polymers is nearly indistinguishable from random copolymers. We evaluate several exposure-deprotection scenarios, and find that a defined sequence copolymer has a distinctive developable image under certain circumstances. The use of defined sequence polymers within a photoresist layer does not automatically result in improved imaging, however they do have some characteristics different from random polymers of the same composition. Further study of these characteristics may provide a route to improved control over the nanoscale imaging process. |
| title | A Comparison of the Spatial Statistics of Random and Defined-Sequence Photoresist Films |
| topic | Soft Condensed Matter Materials Science |
| url | https://arxiv.org/abs/2409.15358 |