Measuring Chemical Shifts with Energy-Dispersive X-ray Spectroscopy
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arXiv
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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866917019033534464 |
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| author | Chen, Yueyun Jin, Rebekah Heffes, Yarin Zutter, Brian O'Neill, Tristan P. Lodico, Jared J. Regan, B. C. Mecklenburg, Matthew |
| author_facet | Chen, Yueyun Jin, Rebekah Heffes, Yarin Zutter, Brian O'Neill, Tristan P. Lodico, Jared J. Regan, B. C. Mecklenburg, Matthew |
| contents | Electron microscopy prevalently uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30-100 eV or 0.01-1 eV, respectively. Large solid angle EDS detector technology has increased collection efficiency to enable precision spectroscopy via averaging of 0.02-0.1 eV. This improved precision gives access to chemical shifts; examples are shown in compounds of Al, Ti, and W. EDS can now detect chemical information in a complementary parameter space (accelerating voltage, thickness, atomic number) to that covered by EELS. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_15639 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Measuring Chemical Shifts with Energy-Dispersive X-ray Spectroscopy Chen, Yueyun Jin, Rebekah Heffes, Yarin Zutter, Brian O'Neill, Tristan P. Lodico, Jared J. Regan, B. C. Mecklenburg, Matthew Materials Science Electron microscopy prevalently uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30-100 eV or 0.01-1 eV, respectively. Large solid angle EDS detector technology has increased collection efficiency to enable precision spectroscopy via averaging of 0.02-0.1 eV. This improved precision gives access to chemical shifts; examples are shown in compounds of Al, Ti, and W. EDS can now detect chemical information in a complementary parameter space (accelerating voltage, thickness, atomic number) to that covered by EELS. |
| title | Measuring Chemical Shifts with Energy-Dispersive X-ray Spectroscopy |
| topic | Materials Science |
| url | https://arxiv.org/abs/2409.15639 |