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Auteurs principaux: Cui, Jixuan, Li, Jun, Mei, Zhen, Ni, Yiyang, Chen, Wen, Li, Zengxiang
Format: Preprint
Publié: 2024
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Accès en ligne:https://arxiv.org/abs/2409.15711
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author Cui, Jixuan
Li, Jun
Mei, Zhen
Ni, Yiyang
Chen, Wen
Li, Zengxiang
author_facet Cui, Jixuan
Li, Jun
Mei, Zhen
Ni, Yiyang
Chen, Wen
Li, Zengxiang
contents The challenge of data scarcity hinders the application of deep learning in industrial surface defect classification (SDC), as it's difficult to collect and centralize sufficient training data from various entities in Industrial Internet of Things (IIoT) due to privacy concerns. Federated learning (FL) provides a solution by enabling collaborative global model training across clients while maintaining privacy. However, performance may suffer due to data heterogeneity-discrepancies in data distributions among clients. In this paper, we propose a novel personalized FL (PFL) approach, named Adversarial Federated Consensus Learning (AFedCL), for the challenge of data heterogeneity across different clients in SDC. First, we develop a dynamic consensus construction strategy to mitigate the performance degradation caused by data heterogeneity. Through adversarial training, local models from different clients utilize the global model as a bridge to achieve distribution alignment, alleviating the problem of global knowledge forgetting. Complementing this strategy, we propose a consensus-aware aggregation mechanism. It assigns aggregation weights to different clients based on their efficacy in global knowledge learning, thereby enhancing the global model's generalization capabilities. Finally, we design an adaptive feature fusion module to further enhance global knowledge utilization efficiency. Personalized fusion weights are gradually adjusted for each client to optimally balance global and local features. Compared with state-of-the-art FL methods like FedALA, the proposed AFedCL method achieves an accuracy increase of up to 5.67% on three SDC datasets.
format Preprint
id arxiv_https___arxiv_org_abs_2409_15711
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Adversarial Federated Consensus Learning for Surface Defect Classification Under Data Heterogeneity in IIoT
Cui, Jixuan
Li, Jun
Mei, Zhen
Ni, Yiyang
Chen, Wen
Li, Zengxiang
Machine Learning
Artificial Intelligence
Signal Processing
The challenge of data scarcity hinders the application of deep learning in industrial surface defect classification (SDC), as it's difficult to collect and centralize sufficient training data from various entities in Industrial Internet of Things (IIoT) due to privacy concerns. Federated learning (FL) provides a solution by enabling collaborative global model training across clients while maintaining privacy. However, performance may suffer due to data heterogeneity-discrepancies in data distributions among clients. In this paper, we propose a novel personalized FL (PFL) approach, named Adversarial Federated Consensus Learning (AFedCL), for the challenge of data heterogeneity across different clients in SDC. First, we develop a dynamic consensus construction strategy to mitigate the performance degradation caused by data heterogeneity. Through adversarial training, local models from different clients utilize the global model as a bridge to achieve distribution alignment, alleviating the problem of global knowledge forgetting. Complementing this strategy, we propose a consensus-aware aggregation mechanism. It assigns aggregation weights to different clients based on their efficacy in global knowledge learning, thereby enhancing the global model's generalization capabilities. Finally, we design an adaptive feature fusion module to further enhance global knowledge utilization efficiency. Personalized fusion weights are gradually adjusted for each client to optimally balance global and local features. Compared with state-of-the-art FL methods like FedALA, the proposed AFedCL method achieves an accuracy increase of up to 5.67% on three SDC datasets.
title Adversarial Federated Consensus Learning for Surface Defect Classification Under Data Heterogeneity in IIoT
topic Machine Learning
Artificial Intelligence
Signal Processing
url https://arxiv.org/abs/2409.15711