Size Effect on Raman Measured Stress and Strain Induced Phonon Shifts in Ultra-Thin Film Silicon

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pashartis, Christopher, van Setten, Michiel J., Pourtois, Geoffrey
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.16188