Zhang, H., Bai, J., Chen, X., Li, C., Zhong, C., Fang, J., & Zhou, G. (2024). Deep-Learning Recognition of Scanning Transmission Electron Microscopy: Quantifying and Mitigating the Influence of Gaussian Noises.
Cita Chicago Style (17a ed.)Zhang, Hanlei, Jincheng Bai, Xiabo Chen, Can Li, Chuanjian Zhong, Jiye Fang, y Guangwen Zhou. Deep-Learning Recognition of Scanning Transmission Electron Microscopy: Quantifying and Mitigating the Influence of Gaussian Noises. 2024.
Cita MLA (9a ed.)Zhang, Hanlei, et al. Deep-Learning Recognition of Scanning Transmission Electron Microscopy: Quantifying and Mitigating the Influence of Gaussian Noises. 2024.
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