Adaptive Single-Terminal Fault Location for DC Microgrids
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arXiv
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| Auteurs principaux: | , , , , , |
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| Format: | Preprint |
| Publié: |
2024
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| _version_ | 1866909325545439232 |
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| author | Nougain, Vaibhav Mishra, Sukumar Rodriguez-Bernuz, Joan-Marc Junyent-Ferre, Adria Shekhar, Aditya Lekic, Aleksandra |
| author_facet | Nougain, Vaibhav Mishra, Sukumar Rodriguez-Bernuz, Joan-Marc Junyent-Ferre, Adria Shekhar, Aditya Lekic, Aleksandra |
| contents | Identifying faulty lines and their accurate location is key for rapidly restoring distribution systems. This will become a greater challenge as the penetration of power electronics increases, and contingencies are seen across larger areas. This paper proposes a single terminal methodology (i.e., no communication involved) that is robust to variations of key parameters (e.g., sampling frequency, system parameters, etc.) and performs particularly well for low resistance faults that constitute the majority of faults in low voltage DC systems. The proposed method uses local measurements to estimate the current caused by the other terminals affected by the contingency. This mimics the strategy followed by double terminal methods that require communications and decouples the accuracy of the methodology from the fault resistance. The algorithm takes consecutive voltage and current samples, including the estimated current of the other terminal, into the analysis. This mathematical methodology results in a better accuracy than other single-terminal approaches found in the literature. The robustness of the proposed strategy against different fault resistances and locations is demonstrated using MATLAB simulations. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_16746 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Adaptive Single-Terminal Fault Location for DC Microgrids Nougain, Vaibhav Mishra, Sukumar Rodriguez-Bernuz, Joan-Marc Junyent-Ferre, Adria Shekhar, Aditya Lekic, Aleksandra Systems and Control Identifying faulty lines and their accurate location is key for rapidly restoring distribution systems. This will become a greater challenge as the penetration of power electronics increases, and contingencies are seen across larger areas. This paper proposes a single terminal methodology (i.e., no communication involved) that is robust to variations of key parameters (e.g., sampling frequency, system parameters, etc.) and performs particularly well for low resistance faults that constitute the majority of faults in low voltage DC systems. The proposed method uses local measurements to estimate the current caused by the other terminals affected by the contingency. This mimics the strategy followed by double terminal methods that require communications and decouples the accuracy of the methodology from the fault resistance. The algorithm takes consecutive voltage and current samples, including the estimated current of the other terminal, into the analysis. This mathematical methodology results in a better accuracy than other single-terminal approaches found in the literature. The robustness of the proposed strategy against different fault resistances and locations is demonstrated using MATLAB simulations. |
| title | Adaptive Single-Terminal Fault Location for DC Microgrids |
| topic | Systems and Control |
| url | https://arxiv.org/abs/2409.16746 |