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Main Authors: Pandey, Ishan, Gupta, Kinshuk, Kumar, Vinod, Khan, A. R., Kamat, Sandhya V.
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2409.17056
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author Pandey, Ishan
Gupta, Kinshuk
Kumar, Vinod
Khan, A. R.
Kamat, Sandhya V.
author_facet Pandey, Ishan
Gupta, Kinshuk
Kumar, Vinod
Khan, A. R.
Kamat, Sandhya V.
contents Single Event Latch-up (SEL) is one of the prime concerns for CMOS ICs used in space systems. Galactic Cosmic Rays or Solar Energetic Particles (SEP) may trigger the parasitic latch up circuit in CMOS ICs and cause increase in current beyond the safe limits thereby presenting a threat of permanent failure of the IC. Mitigation of the SEL is always a challenging task. The conventional mitigation approaches inherently introduce some response time which presents an uncertainty because during this response time the current may exceed the safe current limits. This paper presents a novel circuit based on MOSFETs which provides end-to-end complete solution of detecting SEL, limiting the current below the set threshold and executing power cycling to restore the normal functioning of the CMOS IC. The proposed circuit has been simulated in MULTISIM and the simulation results match very well with the expected behavior of (i)current limiting and (ii) the total time duration taken in power cycling to bring the SEL sensitive device back to its normal operational state. This circuit can be harnessed by spacecraft system designers to overcome the catastrophic threat of SEL posed by space radiation environment.
format Preprint
id arxiv_https___arxiv_org_abs_2409_17056
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A Novel MOSFET based Single Event Latchup Detection, Current Limiting & Self Power Cycling circuit for Spacecraft systems
Pandey, Ishan
Gupta, Kinshuk
Kumar, Vinod
Khan, A. R.
Kamat, Sandhya V.
Systems and Control
Single Event Latch-up (SEL) is one of the prime concerns for CMOS ICs used in space systems. Galactic Cosmic Rays or Solar Energetic Particles (SEP) may trigger the parasitic latch up circuit in CMOS ICs and cause increase in current beyond the safe limits thereby presenting a threat of permanent failure of the IC. Mitigation of the SEL is always a challenging task. The conventional mitigation approaches inherently introduce some response time which presents an uncertainty because during this response time the current may exceed the safe current limits. This paper presents a novel circuit based on MOSFETs which provides end-to-end complete solution of detecting SEL, limiting the current below the set threshold and executing power cycling to restore the normal functioning of the CMOS IC. The proposed circuit has been simulated in MULTISIM and the simulation results match very well with the expected behavior of (i)current limiting and (ii) the total time duration taken in power cycling to bring the SEL sensitive device back to its normal operational state. This circuit can be harnessed by spacecraft system designers to overcome the catastrophic threat of SEL posed by space radiation environment.
title A Novel MOSFET based Single Event Latchup Detection, Current Limiting & Self Power Cycling circuit for Spacecraft systems
topic Systems and Control
url https://arxiv.org/abs/2409.17056