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Bibliographic Details
Main Authors: Ding, Jian, Wang, Jiamin
Format: Preprint
Published: 2024
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Online Access:https://arxiv.org/abs/2409.18492
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author Ding, Jian
Wang, Jiamin
author_facet Ding, Jian
Wang, Jiamin
contents We study random walks in random environments generated by the two-dimensional Gaussian free field. More specifically, we consider a rescaled lattice with a small mesh size and view it as a random network where each edge is equipped with an electric resistance given by a regularization for the exponentiation of the Gaussian free field. We prove the tightness of random walks on such random networks at high temperature as the mesh size tends to 0. Our proof is based on a careful analysis of the (random) effective resistances as well as their connections to random walks.
format Preprint
id arxiv_https___arxiv_org_abs_2409_18492
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Tightness for random walks driven by the two-dimensional Gaussian free field at high temperature
Ding, Jian
Wang, Jiamin
Probability
We study random walks in random environments generated by the two-dimensional Gaussian free field. More specifically, we consider a rescaled lattice with a small mesh size and view it as a random network where each edge is equipped with an electric resistance given by a regularization for the exponentiation of the Gaussian free field. We prove the tightness of random walks on such random networks at high temperature as the mesh size tends to 0. Our proof is based on a careful analysis of the (random) effective resistances as well as their connections to random walks.
title Tightness for random walks driven by the two-dimensional Gaussian free field at high temperature
topic Probability
url https://arxiv.org/abs/2409.18492