Defect detection and size classification in CdTe samples in 3D

Fuente: arXiv

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Bibliographic Details
Main Authors:	Väänänen, M., Kalliokoski, M., Turpeinen, R., Bezak, M., Luukka, P., Karjalainen, A., Karadzhinova-Ferrer, A.
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.18555