Measuring vacancy-type defect density in monolayer semiconductors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Radic, Aleksandar, von Jeinsen, Nick, Perez, Vivian, Wang, Ke, Lin, Min, Liu, Boyao, Zhu, Yiru, Sami, Ismail, Watanabe, Kenji, Taniguchi, Takashi, Ward, David, Jardine, Andrew, Rao, Akshay, Chhowalla, Manish, Lambrick, Sam
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2409.18637