Copertina

Measuring vacancy-type defect density in monolayer semiconductors

Fuente: arXiv

Salvato in:

Dettagli Bibliografici
Autori principali:	Radic, Aleksandar, von Jeinsen, Nick, Perez, Vivian, Wang, Ke, Lin, Min, Liu, Boyao, Zhu, Yiru, Sami, Ismail, Watanabe, Kenji, Taniguchi, Takashi, Ward, David, Jardine, Andrew, Rao, Akshay, Chhowalla, Manish, Lambrick, Sam
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Applied Physics Materials Science
Accesso online:	Acceder al recurso
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