Multiscale Simulation and Machine Learning Facilitated Design of Two-Dimensional Nanomaterials-Based Tunnel Field-Effect Transistors: A Review

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Autori principali: Tsang, Chloe Isabella, Pu, Haihui, Chen, Junhong
Natura: Preprint
Pubblicazione: 2024
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author Tsang, Chloe Isabella
Pu, Haihui
Chen, Junhong
author_facet Tsang, Chloe Isabella
Pu, Haihui
Chen, Junhong
contents Traditional transistors based on complementary metal-oxide-semiconductor (CMOS) and metal-oxide-semiconductor field-effect transistors (MOSFETs) are facing significant limitations as device scaling reaches the limits of Moore's Law. These limitations include increased leakage currents, pronounced short-channel effects (SCEs), and quantum tunneling through the gate oxide, leading to higher power consumption and deviations from ideal behavior. Tunnel Field-Effect Transistors (TFETs) can overcome these challenges by utilizing quantum tunneling of charge carriers to switch between on and off states and achieve a subthreshold swing (SS) below 60 mV/decade. This allows for lower power consumption, continued scaling, and improved performance in low-power applications. This review focuses on the design and operation of TFETs, emphasizing the optimization of device performance through material selection and advanced simulation techniques. The discussion will specifically address the use of two-dimensional (2D) materials in TFET design and explore simulation methods ranging from multi-scale (MS) approaches to machine learning (ML)-driven optimization.
format Preprint
id arxiv_https___arxiv_org_abs_2409_18965
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Multiscale Simulation and Machine Learning Facilitated Design of Two-Dimensional Nanomaterials-Based Tunnel Field-Effect Transistors: A Review
Tsang, Chloe Isabella
Pu, Haihui
Chen, Junhong
Applied Physics
Mesoscale and Nanoscale Physics
Materials Science
Traditional transistors based on complementary metal-oxide-semiconductor (CMOS) and metal-oxide-semiconductor field-effect transistors (MOSFETs) are facing significant limitations as device scaling reaches the limits of Moore's Law. These limitations include increased leakage currents, pronounced short-channel effects (SCEs), and quantum tunneling through the gate oxide, leading to higher power consumption and deviations from ideal behavior. Tunnel Field-Effect Transistors (TFETs) can overcome these challenges by utilizing quantum tunneling of charge carriers to switch between on and off states and achieve a subthreshold swing (SS) below 60 mV/decade. This allows for lower power consumption, continued scaling, and improved performance in low-power applications. This review focuses on the design and operation of TFETs, emphasizing the optimization of device performance through material selection and advanced simulation techniques. The discussion will specifically address the use of two-dimensional (2D) materials in TFET design and explore simulation methods ranging from multi-scale (MS) approaches to machine learning (ML)-driven optimization.
title Multiscale Simulation and Machine Learning Facilitated Design of Two-Dimensional Nanomaterials-Based Tunnel Field-Effect Transistors: A Review
topic Applied Physics
Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2409.18965