Helium atom micro-diffraction as a characterisation tool for 2D materials
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arXiv
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| Main Authors: | , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866929521925554176 |
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| author | von Jeinsen, Nick Radic, Aleksandar Wang, Ke Zhao, Chenyang Perez, Vivian Zhu, Yiru Chhowalla, Manish Jardine, Andrew Ward, David Lambrick, Sam |
| author_facet | von Jeinsen, Nick Radic, Aleksandar Wang, Ke Zhao, Chenyang Perez, Vivian Zhu, Yiru Chhowalla, Manish Jardine, Andrew Ward, David Lambrick, Sam |
| contents | We present helium atom micro-diffraction as an ideal technique for characterization of 2D materials due to its ultimate surface sensitivity combined with sub-micron spatial resolution. Thermal energy neutral helium scatters from the valence electron density, 2-3A above the ionic cores of a surface, making the technique ideal for studying 2D materials, where other approaches can struggle due to small interaction cross-sections with few-layer samples. Sub-micron spatial resolution is key development in neutral atom scattering to allow measurements from device-scale samples. We present measurements of monolayer-substrate interactions, thermal expansion coefficients, the electron-phonon coupling constant and vacancy-type defect density on monolayer-MoS2. We also discuss extensions to the presented methods which can be immediately implemented on existing instruments to perform spatial mapping of these material properties. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2409_20461 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Helium atom micro-diffraction as a characterisation tool for 2D materials von Jeinsen, Nick Radic, Aleksandar Wang, Ke Zhao, Chenyang Perez, Vivian Zhu, Yiru Chhowalla, Manish Jardine, Andrew Ward, David Lambrick, Sam Applied Physics Materials Science We present helium atom micro-diffraction as an ideal technique for characterization of 2D materials due to its ultimate surface sensitivity combined with sub-micron spatial resolution. Thermal energy neutral helium scatters from the valence electron density, 2-3A above the ionic cores of a surface, making the technique ideal for studying 2D materials, where other approaches can struggle due to small interaction cross-sections with few-layer samples. Sub-micron spatial resolution is key development in neutral atom scattering to allow measurements from device-scale samples. We present measurements of monolayer-substrate interactions, thermal expansion coefficients, the electron-phonon coupling constant and vacancy-type defect density on monolayer-MoS2. We also discuss extensions to the presented methods which can be immediately implemented on existing instruments to perform spatial mapping of these material properties. |
| title | Helium atom micro-diffraction as a characterisation tool for 2D materials |
| topic | Applied Physics Materials Science |
| url | https://arxiv.org/abs/2409.20461 |