Operando Ultrafast Damage-free Diffraction-Enhanced X-ray Absorption Spectroscopy for Chemical Reactivity of Polymer in Solvents

Fuente: arXiv
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Autori principali: Peng, Zhengxing, Lainé, Antoine, Ng, Ka Chon, Hua, Mutian, Helms, Brett A., Salmeron, Miquel B., Wang, Cheng
Natura: Preprint
Pubblicazione: 2024
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author Peng, Zhengxing
Lainé, Antoine
Ng, Ka Chon
Hua, Mutian
Helms, Brett A.
Salmeron, Miquel B.
Wang, Cheng
author_facet Peng, Zhengxing
Lainé, Antoine
Ng, Ka Chon
Hua, Mutian
Helms, Brett A.
Salmeron, Miquel B.
Wang, Cheng
contents Chemical recycling of plastics to its constituent monomers is a promising solution to develop a sustainable circular plastic economy. An in-situ X-ray absorption spectra (XAS) characterization is an important way to understand the deconstruction process. However, radiation damage, and long acquisition time, prevent such characterization for fast chemical process. Here, we present a novel experimental technique, which we name Diffraction-Enhanced X-ray Absorption Spectroscopy (DE-XAS), where the plastic material is supported on a graphene layer covering a periodic pattern of holes in a perforated SiNx membrane. The XAS is obtained by measuring the energy-dependent intensity of the X-ray diffracted beams going through the plastic film over the holes in the SiNx membrane. Our method decreases beam damage by orders of magnitude while providing good signal/noise ratio data. We demonstrate the suppression of beam damage with samples of polymethyl methacrylate (PMMA) and the operando characterization of polymer deconstruction process in acid with polydiketoenamine (PDK). This proof-of-concept of the DE-XAS technique shows its great potential for studying fast chemical processes, picoseconds to nanoseconds, using fast CCD detectors with short readout time. We believe the DE-XAS technique offers opportunities for studies of chemical reactions, e.g., photoresist, and many others.
format Preprint
id arxiv_https___arxiv_org_abs_2410_00268
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Operando Ultrafast Damage-free Diffraction-Enhanced X-ray Absorption Spectroscopy for Chemical Reactivity of Polymer in Solvents
Peng, Zhengxing
Lainé, Antoine
Ng, Ka Chon
Hua, Mutian
Helms, Brett A.
Salmeron, Miquel B.
Wang, Cheng
Materials Science
Chemical Physics
Chemical recycling of plastics to its constituent monomers is a promising solution to develop a sustainable circular plastic economy. An in-situ X-ray absorption spectra (XAS) characterization is an important way to understand the deconstruction process. However, radiation damage, and long acquisition time, prevent such characterization for fast chemical process. Here, we present a novel experimental technique, which we name Diffraction-Enhanced X-ray Absorption Spectroscopy (DE-XAS), where the plastic material is supported on a graphene layer covering a periodic pattern of holes in a perforated SiNx membrane. The XAS is obtained by measuring the energy-dependent intensity of the X-ray diffracted beams going through the plastic film over the holes in the SiNx membrane. Our method decreases beam damage by orders of magnitude while providing good signal/noise ratio data. We demonstrate the suppression of beam damage with samples of polymethyl methacrylate (PMMA) and the operando characterization of polymer deconstruction process in acid with polydiketoenamine (PDK). This proof-of-concept of the DE-XAS technique shows its great potential for studying fast chemical processes, picoseconds to nanoseconds, using fast CCD detectors with short readout time. We believe the DE-XAS technique offers opportunities for studies of chemical reactions, e.g., photoresist, and many others.
title Operando Ultrafast Damage-free Diffraction-Enhanced X-ray Absorption Spectroscopy for Chemical Reactivity of Polymer in Solvents
topic Materials Science
Chemical Physics
url https://arxiv.org/abs/2410.00268