Multi-level Memory-Centric Profiling on ARM Processors with ARM SPE

Fuente: arXiv
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Autori principali: Miksits, Samuel, Shi, Ruimin, Gokhale, Maya, Wahlgren, Jacob, Schieffer, Gabin, Peng, Ivy
Natura: Preprint
Pubblicazione: 2024
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author Miksits, Samuel
Shi, Ruimin
Gokhale, Maya
Wahlgren, Jacob
Schieffer, Gabin
Peng, Ivy
author_facet Miksits, Samuel
Shi, Ruimin
Gokhale, Maya
Wahlgren, Jacob
Schieffer, Gabin
Peng, Ivy
contents High-end ARM processors are emerging in data centers and HPC systems, posing as a strong contender to x86 machines. Memory-centric profiling is an important approach for dissecting an application's bottlenecks on memory access and guiding optimizations. Many existing memory profiling tools leverage hardware performance counters and precise event sampling, such as Intel PEBS and AMD IBS, to achieve high accuracy and low overhead. In this work, we present a multi-level memory profiling tool for ARM processors, leveraging Statistical Profiling Extension (SPE). We evaluate the tool using both HPC and Cloud workloads on the ARM Ampere processor. Our results provide the first quantitative assessment of time overhead and sampling accuracy of ARM SPE for memory-centric profiling at different sampling periods and aux buffer sizes.
format Preprint
id arxiv_https___arxiv_org_abs_2410_01514
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Multi-level Memory-Centric Profiling on ARM Processors with ARM SPE
Miksits, Samuel
Shi, Ruimin
Gokhale, Maya
Wahlgren, Jacob
Schieffer, Gabin
Peng, Ivy
Distributed, Parallel, and Cluster Computing
High-end ARM processors are emerging in data centers and HPC systems, posing as a strong contender to x86 machines. Memory-centric profiling is an important approach for dissecting an application's bottlenecks on memory access and guiding optimizations. Many existing memory profiling tools leverage hardware performance counters and precise event sampling, such as Intel PEBS and AMD IBS, to achieve high accuracy and low overhead. In this work, we present a multi-level memory profiling tool for ARM processors, leveraging Statistical Profiling Extension (SPE). We evaluate the tool using both HPC and Cloud workloads on the ARM Ampere processor. Our results provide the first quantitative assessment of time overhead and sampling accuracy of ARM SPE for memory-centric profiling at different sampling periods and aux buffer sizes.
title Multi-level Memory-Centric Profiling on ARM Processors with ARM SPE
topic Distributed, Parallel, and Cluster Computing
url https://arxiv.org/abs/2410.01514