Thermal properties of SnSe nanoflakes by AFM-based Scanning Thermal Microscopy measurements

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ozdogan, M., Iken, T., Cakir, D., Oncel, N.
Format:	Preprint
Published:	2024
Subjects:	Materials Science Mesoscale and Nanoscale Physics Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2410.02009