High-fidelity spin readout via the double latching mechanism
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arXiv
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| Autores principales: | , , , , |
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| Formato: | Preprint |
| Publicado: |
2024
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| Acceso en línea: | |
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| _version_ | 1866914964328939520 |
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| author | Kiyama, Haruki Hien, Danny van Hien Ludwig, Arne Wieck, Andreas D. Oiwa, Akira |
| author_facet | Kiyama, Haruki Hien, Danny van Hien Ludwig, Arne Wieck, Andreas D. Oiwa, Akira |
| contents | Projective measurement of single electron spins, or spin readout, is among the most fundamental technologies for spin-based quantum information processing. Implementing spin readout with both high-fidelity and scalability is indispensable for developing fault-tolerant quantum computers in large-scale spin-qubit arrays. To achieve high fidelity, a latching mechanism is useful. However, the fidelity can be decreased by spin relaxation and charge state leakage, and the scalability is currently challenging. Here, we propose and demonstrate a double-latching high-fidelity spin readout scheme, which suppresses errors via an additional latching process. We experimentally show that the double-latching mechanism provides significantly higher fidelity than the conventional latching mechanism and estimate a potential spin readout fidelity of 99.94% using highly spin-dependent tunnel rates. Due to isolation from error-inducing processes, the double-latching mechanism combined with scalable charge readout is expected to be useful for large-scale spin-qubit arrays while maintaining high fidelity. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2410_03199 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | High-fidelity spin readout via the double latching mechanism Kiyama, Haruki Hien, Danny van Hien Ludwig, Arne Wieck, Andreas D. Oiwa, Akira Mesoscale and Nanoscale Physics Projective measurement of single electron spins, or spin readout, is among the most fundamental technologies for spin-based quantum information processing. Implementing spin readout with both high-fidelity and scalability is indispensable for developing fault-tolerant quantum computers in large-scale spin-qubit arrays. To achieve high fidelity, a latching mechanism is useful. However, the fidelity can be decreased by spin relaxation and charge state leakage, and the scalability is currently challenging. Here, we propose and demonstrate a double-latching high-fidelity spin readout scheme, which suppresses errors via an additional latching process. We experimentally show that the double-latching mechanism provides significantly higher fidelity than the conventional latching mechanism and estimate a potential spin readout fidelity of 99.94% using highly spin-dependent tunnel rates. Due to isolation from error-inducing processes, the double-latching mechanism combined with scalable charge readout is expected to be useful for large-scale spin-qubit arrays while maintaining high fidelity. |
| title | High-fidelity spin readout via the double latching mechanism |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2410.03199 |