Resolution Enhancement of Scanning Electron Micrographs using Artificial Intelligence

Fuente: arXiv

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Bibliographic Details
Main Authors:	Reclik, Tom, Medghalchi, Setareh, Schumacher, Philipp, Wollenweber, Maximilian, Al-Samman, Talal, Korte-Kerzel, Sandra, Kerzel, Ulrich
Format:	Preprint
Published:	2024
Subjects:	Image and Video Processing Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2410.03746