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Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature

Fuente: arXiv

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Bibliographic Details
Main Authors:	Steidl, Timo, Kuna, Pierre, Hesselmeier-Hüttmann, Erik, Liu, Di, Stöhr, Rainer, Knolle, Wolfgang, Ghezellou, Misagh, Ul-Hassan, Jawad, Schober, Maximilian, Bockstedte, Michel, Gali, Adam, Vorobyov, Vadim, Wrachtrup, Jörg
Format:	Preprint
Published:	2024
Subjects:	Quantum Physics
Online Access:	Acceder al recurso
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